MEMORANDUM OPINION AND ORDER
MICHAEL J. DAVIS, District Court.
This matter is before the Court for a Markman Hearing to construe claims in U.S. Patent No. 6,826,298 ("the '6,298 patent"), which describes an "automated, Wafer defect inspection system and a process of performing such inspection."
Background
The inventions of the '6,298 patent were developed by a Minnesota corporation, August...
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