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NOVA MEASURING INSTRUMENTS v. NANOMETRICS, INC.

No. C 05-0986 MMC (BZ).

417 F.Supp.2d 1121 (2006)

NOVA MEASURING INSTRUMENTS LTD., Plaintiff(s), v. NANOMETRICS, INC., Defendant(s).

United States District Court, N.D. California.

March 6, 2006.

Attorney(s) appearing for the Case

Neil A. Smith, David Schnapf, Sheppard, Mullin, Richter & Hampton LLP, Douglas A. Winthrop, San Francisco, CA, for Plaintiff.

Ronald Craig Finley, Daniel Harlan Fingerman, Jeremy Michael Duggan, Mount & Stoelker, P.C., San Jose, CA, James A. Diboise, Wilson Sonsini Goodrich & Rosati Professional Corporation, San Francisco, CA, for Defendant.

THIRD DISCOVERY ORDER

ZIMMERMAN, United States Magistrate Judge.

Before the court is plaintiff Nova Measuring Instruments' motion to compel defendant Nanometrics' production of documents pursuant to Patent L.R. 3-4. The parties disagree (1) whether the documents produced must be in their native file format, with original metadata, and (2) whether the documents produced are sufficient to show the operation of each aspect or element of the claims identified...

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